Blog


20

Feb 2015

3rd Annual Barksdale AFB IT Expo

Come and see us at the 3rd Annual Barksdale AFB Information Technology Expo hosted by the AFCEA ArkLaTex Chapter! Shane Robinson, Government Contract Sales Manager, will be on hand to help answer questions about how Chroma Systems Solutions can provide an electrical testing solution for your business needs, from design to production. We currently support the Airforce’s VDATS system, and we encourage to stop by...

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Solar Array Simulation Softpanel for Dynamic Shadowed I-V Curve Simulation With Up to 4096 Data Points

17

Feb 2015

Solar Array Simulation Softpanel for Dynamic Shadowed I-V Curve Simulation With Up to 4096 Data Points

The PV Array and PV Inverter are two major components of a photovoltaic power generation system. The efficient performance of the PV Array and PV Inverter determine the return on investment of a PV power generation system over the long run. Therefore, it is necessary to consider the weather, irradiance, and temperature change characteristics of the operating region when building a PV system. Additionally, the optimal performance...

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Museum Dedicates B-17 Powered By Chroma DC Power Supplies

04

Feb 2015

Museum Dedicates B-17 Powered By Chroma DC Power Supplies

The Mighty Eighth Air Force Museum dedicates its B-17 ‘City of Savannah’ Restoration Project to hundreds of spectators. Foothill Ranch, CA: On Wednesday, January 28, 2015, The Mighty Eighth Air Force Museum dedicated its B-17 ‘City of Savannah’ Restoration Project to hundreds of spectators including World War II veterans, current military personnel and the many volunteers to honor of the 5,000th combat aircraft processed at...

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29

Sep 2014

Chroma Adds New 10MHz HF LCR Meter

PRLog – Sep. 29, 2014 – FOOTHILL RANCH, Calif. – Chroma Systems Solutions announces today the addition of the Chroma 11050 HF LCR Meter precision test instrument designed to accurately measure and evaluate passive components at high speeds. Its measurement capabilities cover the primary and secondary parameters required for testing the inductance, capacitance, resistance, quality factor and loss factor of passive components. Click here to read the full story.


19

Nov 2013

Chroma Introduces a Compatibility Test Solution for Electric Vehicle and EV Supply Equipment (EVSE)

The media recently reported that electric vehicles cannot be charged in public locations due to incompatibility issues, some EV Supply Equipment (EVSE) installed in public locations are not provided by the manufacturer of the vehicle but by secondary manufacturers in the industry. The incompatibility arises from a lack of verification in the communication protocol resulting in a charge failure or other hazardous conditions. This could...

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21

May 2013

TEC used for Thermal Test of Semiconductors

Semiconductor testing at a wide range of temperatures during manufacturing test, with the DUT operating, was originally considered a Military Grade application. However, with the increase in Mobile devises, and the variety of environments they are used in, The IC’s and Semiconductors require more stringent testing at wider operating temperature ranges. The term Tri-Temp Test is used to describe this test requirement that can range...

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