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DC Electronic Loads

DC Electronic Loads

DC Electronic Loads

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63472 High Slew Rate DC Electronic Load

63472 High Slew Rate DC Electronic Load
  • Designed for VRM, embedded VRD and Intel® ItaniumTM Power Pod testing
  • Static Loading:
    Power rating: 200W
    Voltage range: 0-2V
    Current range: 150A
  • Dynamic Loading:
    Current range: 150A
    Slew rate: Up to 1000A/ s
    Dynamic Freq: Up to 1MHz
    Duty control: 10-90%
  • Built-in and user definable VID tables for flexibility
  • Efficiency test
  • Timing measurement for PowerGood
  • Dynamic VID simulation
  • Current monitor output
  • Measurements:
    Static mode: Vdc, Idc
    Dynamic mode: Vpk+, Vpk-
    Dynamic VID: Vpk check, Vdc for last VID
  • Customized adapter boards for different types of VRMs, CPU sockets or Power Pod
  • Full protection: OP,OC and OV protection
  • Versatile remote controller
  • GPIB and drivers interface
  • LabView Soft-panel
  • Download Data Sheet

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As a result of the exploding increase in CPU complexity according to Moore's Law, all modern processors require a low voltage with high instantaneous current power source. Voltage Regulator Modules, along with embedded solutions, are the only way to correctly supply these currents. A need to simulate this low voltage, high current with fast di/dt loading has become more important than ever. Every main board design using a VRM, Intel® ItaniumTM power pod or an embedded regulator (VRD) will need processor voltage supply performance qualification.

Incorporates Intel®'s Latest Processor

Using new slew rate and loading control techniques, Intel® recently introduced the latest generation PTT to address ultra-fast processor di/dt requirements.

The PTT is controllable by external analog and clock signals. It will sink step currents up to 150A at slew rates over 1000A/ s, with repetition rates up to 1MHz. Users may drive this component with a traditional DAQ card and/or signal generator, or, simply choose to use the Chroma 63472 to obtain a complete test solution.

Auto Calibration

Because the PTT is an "open loop" design, a constant calibration scheme for assuring accurate loading levels and slew rates is necessary. The Chroma 63472 has built-in means for accomplishing real-time, on-the-fly calibrations. Using a high speed ADC and comparators, all necessary calibrations are automatically performed before any measurement reading is taken to ensure accuracy.

63472 Output Characteristics

The following paragraph explains why the automatic calibration feature is required:

63472 Transfer CharacteristicsAny change in the PTT unit heatsink temperature will cause a dramatic Id drift in the loading transistors and make the load current inaccurate, if the drive voltage signal is not corrected for continuously. This, combined with the non-linearity of the Vgs/Id response, makes a very difficult control scenario. Without the automatic calibration feature of the Chroma 63472, the PTT load current accuracy may be compromised.






Static Loading Simulation

63472 Input Current CharacteristicsIn order to physically fit into all current and future CPU sockets, the PTT heat sink volume is small and therefore cannot reliably dissipate the huge amount of heat generated when loading a processor power source continuously.

The Chroma 63472 has a built-in 200W DC electronic load for converter design / development, thermal studies, and reliability testing. It can sink its full rated current down to 0.5V, exceeding all existing processor voltage requirements.

Efficiency Test

Real time measurement of UUT input/output voltage and current is integrated in the 63472 control and measurement unit using 16 bits precision measurement circuit, user can easily get the UUT efficiency.

63472 Efficiency Formula

PWRGD Timing

With the unique timing measurement of UUT power good signal. User can setting the start trigger (in %) of Vout voltage and end trigger level of PWRGD signal to get PWRGD timing.

63472 Power Good Trip Points

VID Control / Dynamic Simulation

63472 VID TestingThe Chroma 63472 provides two built-in VID tables for the VRM10.X and VRM9.X series. There are also three user definable VID tables that allow the user to expand for future VID coding schemes.

For the VRM10.X series regulator, a unique dynamic VID function needs to be tested. The Chroma 63472 allows a user to specify any number of VID steps within the programmed VID table. In addition, the step time may be reduced to as little as 5 s. Measurement of the output voltage behavior throughout the entire Dynamic VID sequence is supported.

General Measurements

63472 Voltage MeasurementsThe Chroma 63472's comprehensive measurement capability provides all the necessary voltage (Vpk+ and Vpk-) and current information for both static and dynamic CPU "load-line" measurements.

In the Dynamic VID simulation mode, the measurement system captures the peak voltage reading and compares it with the Dynamic VID specification limits. Any value found outside of the boundaries is flagged as a failure.

UUT output voltage and current readings are measured through two separate SMA connectors on the unit's front panel. This provides the user with the flexibility to locate the most desirable voltage measurement point on any particular main board. Doing so will maximize accuracy of the measurement values and minimize external noise interference.

Embedded VRD Testing

Customized designed adapter boards are available for most popular Intel®'s CPU sockets such like sockets 478, 604 etc. This enable not only system integrator or M/B makers to perform full functional test against VRM on board or VRD.

63472 VRD Testing

63472 High Slew Rate Applications


63472 High Slew Rate Applications

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