Semiconductors


21

May 2013

TEC used for Thermal Test of Semiconductors

Semiconductor testing at a wide range of temperatures during manufacturing test, with the DUT operating, was originally considered a Military Grade application. However, with the increase in Mobile devises, and the variety of environments they are used in, The IC’s and Semiconductors require more stringent testing at wider operating temperature ranges. The term Tri-Temp Test is used to describe this test requirement that can range...

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