High Frequency LCR Meters up to 30MHz – 11050
- Test Parameters: L/C/R/Z/Y/DCR/Q/D/ θ
- Test Frequencies: 75kHz~30MHz / 1kHz~10MHz / 60Hz~5MHz
- Test Level: 10mV ~ 5V
- Basic Accuracy: 0.1%
- 7ms high speed measurement
- 3 output impedance modes
- Test signal monitoring function
- Compare & bin-sorting function
- Open/short zeroing & load correction functions
- Detached measurement & display unit design
- Standard Handler, RS-232C, USB storage & external bias current control interface
- Optional GPIB or LAN interface
The Chroma 11050 Series HF LCR Meter is a precision test instrument designed to accurately measure and evaluate passive components at high speeds. Its measurement capabilities cover the primary and secondary parameters required for testing the inductance, capacitance, resistance, quality factor and loss factor of passive components. The HF LCR Meter has a broad testing frequency range 75kHz~30MHz/1kHz~10 MHz/60Hz~5MHz suitable for analyzing component characteristics under different frequencies. Its 0.1% basic measurement accuracy provides stable and highly reliable results. A fast 7ms measurement speed effectively increases productivity when working in an automated environment.
In addition to the excellent measurement features found in other Chroma LCR Meters, the 11050 Series provides additional useful functions. It has 3 output impedance modes to satisfy demands for measuring and working with other instruments. The versatile digital display can be configured to best fit the current testing resolution; furthermore, the test signal monitoring function displays the voltage and current that is actually carried to the DUT. The timing settings of trigger delay, measure delay and average number of times allow the measurements to transfer seamlessly to an automated test environment providing accurate results within a limited testing time.
The detached design of the Chroma 11050 uses a dual CPU system for processing the testing and display individually. This not only increases testing speed but also shortens test lead lengths when used with automated machines to improve the accuracy of high frequency measurements.
Chroma’s 11050 Series HF LCR Meter has multiple remote interface options. Handler and RS-232C remote interfaces come standard for software or hardware control of test conditions, measurement triggers, judge test results, and collecting measured data. The standard USB port saves device settings and controls the output of an external DC bias current source. Optional GPIB and Ethernet remote interfaces are available as well for software control.
Due to the design of modern portable electronic communication devices with thin form factors and low power consumption, required frequency testing of power inductors is increasing. The equivalent series resistance of components has become a critical indicator to identify if it is good or bad. The buffer capacitor plays an important role for overall circuit reliability and must function properly under various voltage transient conditions; the equivalent series resistance must remain at a very low level when operated at high frequencies. The Chroma 11050 Series is focused on testing passive components at high frequencies and with enhanced key measurement capabilities during R&D so that it simulates the user’s actual application as closely as possible. The increased accuracy of low impedance measurements demonstrates the usefulness of Chroma 11050 in high frequency testing applications.
The Chroma 11050 Series HF LCR Meter was designed with many enhancements and key features to make it the best choice to meet the demands of modern component characterization analysis and high speed testing for automated production line or incoming/outgoing inspection applications.
Test Modes – Basic
Test Modes – Multi-Point
LCRZ mode is designed for testing frequency-dependent and voltage-dependent parameters. Capacitor and inductors impedance and equivalent series resistance tend to be affected by changes of frequency. And because of dielectric characteristics, a ceramic capacitors capacitance is sensitive to test voltage. By LCRZ mode, it is easy to evaluate these characteristics.
Bias Scan Mode
Bias scan mode is designed for testing the saturation characteristic of magnetic components. The inductance and impedance of an inductor drops with the increase of bias current. Integrated with Chroma bias current source, the HF LCR meter can control the current setting and output. Bias scan mode is helpful to program the test process.
Test Modes – Analyzer
Parameter Sweep Mode
Parameter sweep mode is designed for plotting various characteristic curves. Up to 401 plotted points make the curve smoother. Users can use reference curve store/recall function to easily compare two curves. If there is a need to check the detailed measurements, just turn on the cursor or switch to table mode.
Test Modes – Automation
Dual Frequency Mode
Dual frequency mode is designed for calculating the percentage variance between measurements at two frequencies. The calculated result can show the characteristics relative to the quality. For example, the percentage variance of inductance can be applied to evaluate the power loss of the core at high frequencies.
Bias Compare Mode
Bias compare mode is designed for calculating the inductance drop percentage of a magnetic component while bias current flows through it. Compared with the general absolute value judgment method, the drop percentage is more effective to sort out inductors with poor saturation characteristics.
|11050||1kHz ~ 10MHz LCR Meter|
|11050-5M||60Hz ~ 5MHz LCR Meter||11050-30M||75kHz ~ 30MHz LCR Meter|
|A110501||4-Terminal SMD Test Fixture|
|A110211||Test Fixture (DIP)|
|A110234||Test Leads (1M)|
|A133510||LAN & USB-H Interface|
|A133509||GPIB & Handler Interface|
100Hz-50kHz LCR Meter – 11021/11021-L
Test frequencies: 100Hz, 120Hz, 1kHz and 10kHz (9.6kHz); 1kHz, 10kHz, 40kHz, 50kHz
50Hz-100kHz LCR Meter – 11022/11025
0Hz, 60Hz, 100Hz, 120Hz, 1kHz, 10kHz, 20kHz, 40kHz, 50kHz, 100kHz test frequencies
Capacitor Leakage Current/IR Meter – 11200
0.001uA - 20.00mA leakage current test range with 4 digits resolution