Exploring Power Inductor – Impulse Winding Tester
Specifically designed for wound component tests, utilizes a high voltage & low capacitance capacitor (low test energy) in parallel with a coil to form an RLC resonant
The “Impulse Winding Test” is a “non-destructive” technique that applies a high speed and low voltage pulse to the DUT and adds an impulse voltage on the oscillation capacitor (Cs) of the parallel coil so that the parallel capacitor and coil will generate an LCR oscillation. The oscillation attenuation can be viewed to realize the internal state of the coil including insulation, inductance and parallel capacitance (Cw) (See image: Equivalent Circuit Test Diagram). Next, analyze and compare the equivalent waveform of a good and bad DUT for pass and fail judgment. The function of the impulse winding test is to discover the potential defects – such as a winding layer short, poor electrode welding, and poor internal coil or core insulation, etc. as early as possible.
Chroma 19301A is specifically developed for testing low inductance winding components. The layer short test for inductance on the products is from 0.1uH to 100uH. The test for a low inductance DUT is different from general products as it is easily affected by the equivalent wiring inductance on the test circuit that makes the test voltage to distribute to wiring and the DUT voltage to become much lower than the set voltage during measurement. Furthermore, the working voltage of a low inductance power choke is used for low voltage, thus the impulse test voltage is normally lower than common inductance products.
|19301A||Impulse Winding Tester (Low Inductance)|
|A193001||SMD Choke Test Kit|
|A193002||1m Test Wire + Test Clip|
|A193003||1m Test Wire + Flat Head Cutting|
|A193004||1m Test Cable BNC to BNC (incl. BNC Male Connector *2)|
High/Low Inductance Test (0.1uH~100uH)
18mS High Speed Test
(P1.0 for ACQ)
USB Port for Storing Waveform & Screen Capture
LAN, USB, and
Webinar: Electrical Safety Testing 101
Chroma Impulse Winding Tester 19301A