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Jan 2014Epistar Corp. adopts Chroma’s LED Power Driver ATS Solution
The professional LED chip manufacturer – EPISTAR CORPORATION has adopted the LED automatic test system provided by Chroma to enhance the LED product advantage by simulating and testing the LED power electrical properties of various types. Click here to read the full story.
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Nov 2013Chroma Introduces a Compatibility Test Solution for Electric Vehicle and EV Supply Equipment (EVSE)
The media recently reported that electric vehicles cannot be charged in public locations due to incompatibility issues, some EV Supply Equipment (EVSE) installed in public locations are not provided by the manufacturer of the vehicle but by secondary manufacturers in the industry. The incompatibility arises from a lack of verification in the communication protocol resulting in a charge failure or other hazardous conditions. This could...
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Nov 2013New High Power Regenerative Grid Simulators Test On-grid Products
Chroma’s 61800 45kVA and 60kVA Regenerative Grid Simulators have advanced features to satisfy regulation testing to standards such as IEEE 1547 / IEC 61000-3-15 / IEC 62116 ensuring proper and safe operation of on-grid products.
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Sep 2013Chroma Systems Solutions to Include Software for a Limited Time
For a limited time, Chroma Systems Solutions will include their remote operation softpanels with the purchase of participating test instrumentation at no charge.
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Sep 2013Chroma’s Wound Component Analyzer Combines Many Tests
Chroma releases the industry's first Wound Component Electrical Safety Test (EST) Analyzer that combines impulse winding, AC/DC hipot, insulation resistance and DC resistance test measurement functions suitable to test to UL standards.
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May 2013TEC used for Thermal Test of Semiconductors
Semiconductor testing at a wide range of temperatures during manufacturing test, with the DUT operating, was originally considered a Military Grade application. However, with the increase in Mobile devises, and the variety of environments they are used in, The IC’s and Semiconductors require more stringent testing at wider operating temperature ranges. The term Tri-Temp Test is used to describe this test requirement that can range...
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06
May 2013Chroma Announces Multiple Phase Power Meters
Chroma Systems Solutions, Inc. releases new precision AC and DC digital power meters designed for multiple phase power measurement applications expanding its line of high speed, high accuracy 66200 series power meters.
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Apr 20136310A Programmable DC Electronic Load Overview
Check out our new video overview of the 6310A Programmable DC Electronic Load!
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Mar 2013Chroma Contributed Award Winning Indie Short Film Selected for GI Film Festival
Chroma Systems Solutions contributed to the production of the short independent film Dog It Down in Los Angeles, California. The film, set in WWII Pearl Harbor, won Best Short Film at the 2012 Hollywood Reel Independent Film Festival and was recently announced as an official selection for the 2013 GI Film Festival (GIFF) in Washington, DC. The entire film was shot aboard the S.S. Lane...
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Mar 2013Chroma Sync Hipot Tester Measures Up To 100 Channels Simultaneously
The 19020 was developed with the world's first synchronous Hipot test function allowing one single unit to perform 10 channels sync output and measurements at the same time. A maximum of 10 units can be controlled for 100 channels in total. They can be grouped for output to avoid creating voltage differences. Chroma’s 19020 synchronizes the output signal removing risk of high voltage differences on adjacent DUT’s minimizing any occurrence of error in the test. Taking 5kVac output voltage for example, when the output of Hipot tester is not synchronized, two nearby DUT’s may create a difference of high voltage discharge of up to 14kV peak-peak causing damage to the fixture and erroneous testing.